Previous projects undertaken

The Projects listed below are some of the test automation projects successfully completed by the partners of Definitive Test Automation

 

B Scan Flaw Detector

Design and manufacture of an Automated Test solution to verify hardware met production specifications. The test platform consisted of a PXI rack and custom PCI hardware which produced pass /fail criteria and a report upon test completion. Aspects
of test included high voltage ultrasound pulsers, FPGA register level access, Analogue receiver front end calibration. SPI, PCI, VISA I/O functions used in Software as well as
all aspects of GUI Design.

 

Previous project experience outside of DT Automation

Below are some of the interesting projects we have the privilege of experiencing through our LabVIEW careers. The range and technical level of these projects have enabled Definitive Measurements to come to existence.

 

Digital Compensation of RF Amplifier

Design of automated characterisation and verification of Solid State Power Amplifier.
The RF amplifier was open loop controlled and LabVIEW was used to measure
amplifier control parameters. These parameters were then developed into a control algorithm, embedded into digital lookup tables and then RF performance was verified with LabVIEW against specification. Project utilised PXI, GPIB controlled RF
Instruments, C, Matlab, 2D Interpolation, Control techniques, Digital Design and GUI Design.

 

Eddy current NDT (Non Destructive Testing) system

High speed data acquisition system for capturing Eddy Current readings real time from the rail surface as the Eddy Current probes passed over the rail. This data would
indicate if surface defects were present, giving location, which could then be analysed off-line providing non-stop testing. The work included integration of a MARPOSS Eddy Current system with an Ultrasonic system using LabVIEW.

 

RF Test Software for LTE communications

Design of software running on a test platform used for next generation RF mobile communications. The test platform allowed LabVIEW software to be written which used PXI Digitiser for the capture a demodulation of LTE signals. These signals were tested for ACLR (Adjacent Channel Leakage Ratio), BER (Bit Error Rate) and the display of QAM signals. These test were used for the production testing of the test platform which was sold to leading mobile communication companies which would develop product software on them. Project included PXI, High speed digitisers and RF De-modulation techniques.

LabVIEW Developers and Consultants in Portsmouth Hampshire
National Instruments

© DTA 2010

Home | News | About us | Services | Previous Projects

Products | Typical Case Studies | Contact Us